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手持式光譜儀手持式合金分析儀合金分析儀

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手持式光譜儀手持式合金分析儀合金分析儀

XRF

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EDX4500H

Type:EDX4500H
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Product description, Technical parameters and configuration

Based on XRF detection technology, X-ray Fluorescence Spectrometer—EDX4500H achieves rapid, accurate and non-destructive analysis to various kinds of elements. Incorporating intelligent vacuuming system and XRF technology, this instrument features great excitation and accurate analysis to Si, P, S, Al, Mg and other light elements, especially to high content Cr, Ni, Mo and some other focus elements. With short testing time, this instrument greatly improves test and work efficiency during smelting control process. Besides, this instrument is also widely applied for alloy analysis, full-elements analysis and hazardous elements analysis.

Performance Advantages

High efficient and extremely thin window X-ray tube which achieves international advance level 
Newest digital multi-channel technology improves testing efficiency, accuracy and counting ability to 100000CPS, which enjoys better effects on alloy testing. 
Silicon Drift Detector (SDD), great energy linearity, excellent energy resolution and spectrum, high peak/base rate
Skyray Instrument patent product –Signal-to-Noise Enhancer (SNE), improves signal processing ability by 25 times
Low energy X-ray excitation to elements, great excitation to Si, P and other light elements 
Intelligent vacuuming system eliminates air influences, which greatly improves testing range 
Automatic spectrum-stabilizing device ensures stability of the instrument 
High Signal-to-Noise electronic circuit unit
Automatic switch of collimators and filters instead of manual operation 
Analysis spectrum technology ensures great repeatability 
Multi-parameter linear regression method restrains absorptions between different elements 
Built-in HD camera 
LCD screen directly displays testing results (tube voltage, tube current, and vacuum degree)

Technical Specifications

Product type: EDX 4500H
Product name: X-ray Fluorescence Spectrometer 
Analytical elements: Na to U
Analytical range: ppm—99.99% (different elements enjoy different analytical range)
Simultaneously analysis: capable of testing tens of elements simultaneously 
Precision: 0.05% (content ≥96%, test for 21 times)
Measurement time: 30—200s
Energy resolution: 145±5eV
Tube voltage: 5KV-50KV 
Tube current: 50μA-1000μA
Measurable objects: powder, solid, liquid 
Voltage input: AC 110V/220V 
Temperature: 15℃-30℃ 
Humidity: 35%-70%
Sample chamber dimensions: 20mm×100mm
Instrument dimensions: 660mm×510mm×350mm 
Weight: 65Kg

Standard Configurations

High-efficient and extremely thin window X-ray tube 
Silicon Drift Detector (SDD)
Digital Multi-channel technology 
Signal-to-Noise Enhancer 
Optical amplify system 
High signal-to-noise electronic circuit unit 
Built-in HD camera 
Automatic switch of collimators and filters 
Automatic-stabilizing spectrum device 
Triple safety protection mode 
Reliable steel structure 
90mm×70mm LCD
Vacuum pump

Application Fields

Alloy testing, full-elements analysis, hazardous elements detection (RoHS, halogen)

CONTACT US

Call us for more information
800-9993-800
400-7102-888
Nonworking Hotline
139 1323 1381
leave us a message
Online Message
AS of webchat QR code


手持式光譜儀手持式合金分析儀合金分析儀
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